Dilatometer NETZSCH DIL 402 Expedis Supreme has been installed in the thermal characterization laboratory at west palashi campus. The new dilatometer offers
state-of-the-art dilatometer technology and is manufactured for a wide range of sophisticated applications. Silicon carbide (SiC) is used as heating element and sample can be heated from room temperature to 1550 o C. It has new measuring system called ‘Nano Eye’ where resolution is 0.1nm. Furthermore, analysis software (Proteus) is installed with the system which has versatile functions and produces reliable results.