Crystallinity, surface morphology and compositional analysis
X-Ray Diffraction Technique
X-ray diffraction (XRD) is a powerful nondestructive technique for characterizing crystalline materials. Our XRD (model: Empyrean, PANalytical-Netherlands) provides information on structures, phases, preferred crystal orientations (texture), strain, and other structural parameters, such as crystal size, crystallinity, and crystal defects.
Field Emission Scanning Electron Microscope (FESEM) with EDS attachment
GCE have a state-of-the-art FESEM (model: JSM 7600F, JEOL-Japan) at Electron Microscopy laboratory allowing topographical observation at nanometer scale resolution (1.4 nm). The equipment is also attached with EDS capable of elemental identification and mapping.
X-Ray Fluorescence (XRF) Spectroscopy
X-ray Fluorescence Spectroscopy (model: Lab Center XRF-1800, Shimadzu Japan) is a state-of-the-art analytical method to determine the chemical composition of all kind of materials in solid, liquid, and powder form. Using Certified Reference Materials (CRM), XRF gives highly accurate result in parts per million (ppm) levels, which is hard to achieve using wet method.
Electrical and optical characterization
GCE has an advanced dual beam UV/Vis/NIR Spectrometer (model: LAMBDA 1050, PerkinElmer-USA) capable of performing quantitative analysis for the determination of diffuse and specular of any type of surface (glass, metal etc.), measurement of transmission and absorption of transparent/translucent solids and liquids.
Ferroelectric Measurement System
Precision Multiferroic test system (model: P-PMF, Radiant Tech. Inc.-USA) attached with 10 kV high voltage interface (model: P- HVi210KSC), amplifier (model: Trek 609B), and horizontal tube furnace (T max 1100 o C) to characterize the electrical properties of materials and devices. It can measure electric field, frequency and temperature dependent (up to 600 o C) electric polarization, capacitance, conductivity as well as magnetoelectric coupling of multiferroic bulk and thin film. In addition to that, PUND (Positive Up Negative Down), ferroelectric fatigue and imprint tests could also be performed adopting customized programs.
Wayne Kerr Series 6500B Precision Impedance Analyzer available at GCE provides precise and fast testing of components at frequencies up to 15 MHz and temperature up to 600 o C.